Refine your search
Collections
Co-Authors
Journals
Year
A B C D E F G H I J K L M N O P Q R S T U V W X Y Z All
Vishnupriya, K. R.
- Sensitivity of ft to Process Parameter Variation in 30 nm Gate Length Fin FETs
Abstract Views :167 |
PDF Views:2
Authors
Affiliations
1 Department of Information Technology in SSN College of Engineering, Kalavakkam – 603 110, Chennai, Tamilnadu, IN
2 Department of Information Technology in SSN College of Engineering, Kalavakkam – 603 110, Chennai, Tamilnadu, IN
1 Department of Information Technology in SSN College of Engineering, Kalavakkam – 603 110, Chennai, Tamilnadu, IN
2 Department of Information Technology in SSN College of Engineering, Kalavakkam – 603 110, Chennai, Tamilnadu, IN