International Journal of Innovative Research and Development

Abstract

The precursors of _MgxNb2O_x+5 for x = 1-6 ceramics were prepared by conventional solid state reaction method. X-ray diffraction and scanning electron microscopic techniques were used for the characterization. Microwave dielectric properties of the samples were measured using an Agilent network analyzer. Better dielectric properties were observed for the series of Mg_xNb₂O_x+5 ceramics. Dielectric properties were tuned by the substitution of Nb₂O₅ with TiO₂ in the chemical formula (x) MgO-(1-y) Nb₂O₅-(5y/2) TiO₂ for x = 2, 3, 5 & 6 and y = 0-1.

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