Journal of Geological Society of India (Online archive from Vol 1 to Vol 78)

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Lattice Preferred Orientation Analysis of Deformed Quartz: An Advanced Application of High Resolution X-Ray Diffractometer


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1 National Geophysical Research Institute (CSIR), Uppal Road, Hyderabad - 500 606, India
     

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The lattice preferred orientation analysis of quartz c-axis has been used to study the fabric elements in deformed quartz. Application of X-ray texture goniometer attached with high resolution X-ray diffractometer is used to improve the quality of the studies related to texture analysis, which is difficult to observe under conventional optical microscopic method. A comparison is made in between the conventional optical microscope and XTG method using a quartz sample from Malanjkhand reef is used to demonstrate the difference obtained within fabric elements. In photomicrograph, only one fabric component is observed while pole figure analysis using XTG method depicts three components of deformation. This technique is also very useful in the study of polymineralic rocks as well as deformation induced in synthetic materials.

Keywords

Lattice Preferred Orientation, X-Ray Texture Goniometer, Pole Figure, Quartz, Deformation.
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  • Lattice Preferred Orientation Analysis of Deformed Quartz: An Advanced Application of High Resolution X-Ray Diffractometer

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Authors

Dinesh Pandit
National Geophysical Research Institute (CSIR), Uppal Road, Hyderabad - 500 606, India

Abstract


The lattice preferred orientation analysis of quartz c-axis has been used to study the fabric elements in deformed quartz. Application of X-ray texture goniometer attached with high resolution X-ray diffractometer is used to improve the quality of the studies related to texture analysis, which is difficult to observe under conventional optical microscopic method. A comparison is made in between the conventional optical microscope and XTG method using a quartz sample from Malanjkhand reef is used to demonstrate the difference obtained within fabric elements. In photomicrograph, only one fabric component is observed while pole figure analysis using XTG method depicts three components of deformation. This technique is also very useful in the study of polymineralic rocks as well as deformation induced in synthetic materials.

Keywords


Lattice Preferred Orientation, X-Ray Texture Goniometer, Pole Figure, Quartz, Deformation.

References