Development of a Fast, Reliable Fringe Projection Profilometry System

R. Madhusudhan Rao; R. Deepa; V. Kavitha; S. Usha

Development of a Fast, Reliable Fringe Projection Profilometry System

R. Madhusudhan Rao , R. Deepa , V. Kavitha , S. Usha

Affiliations
1 Central Manufacturing Technology Institute (CMTI), Tumkur Road, Bengaluru, India

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Structured Light Scanning (SLS) systems have become popular for their reliability and accuracy. In this work, Fringe Projection based SLS system has been developed. Usage of Multi-level Quality Guided Phase unwrapping algorithm for recovering the true phase map is presented; System calibration, along with the process of recovering depth from phase is explained. Finally measurement results are presented to reaffirm the fact that phase shifting technique along with quality guided spatial unwrapping can be used for fast, full field 3D-Scanning.