Machine Vision for Metrology Applications

Conventional coordinate measuring machine posses problem for handling delicate components. Optical profile projectors require enormous time for manual cursor positioning to make measurements. A separate setup is called for inspecting the surface finish (microscope). These issues are addressed by a single setup using vision techniques for both precision measurements as well as to identify surface defects. This paper discusses about machine vision technique for metrology requirement and explain how ‘Vision for Metrology’ differs in terms of sensor requirement, lighting techniques, calibration methods and algorithm from a conventional vision system used for feature identification, recognition etc.