Open Access Open Access  Restricted Access Subscription Access
Open Access Open Access Open Access  Restricted Access Restricted Access Subscription Access

Investigations into Roughness of Mass Standards at NPL-I


Affiliations
1 National Physical Laboratory (CSIR), New Delhi-110012, India
     

   Subscribe/Renew Journal


The surface quality of mass standards is on important parameter. Surface roughness of moss standards is important as it is known to be related to contamination with pollutants (such as adsorbed water vapors etc.) and the stability of moss standards. There is a growing interest in surface roughness measurement among mass metrologist. In the present paper we present the work carried out to investigate the roughness of mass standards and try to correlate it with stability of mass standards.

Keywords

Roughness, Mass Standards, White Light Interferometry.
User
Subscription Login to verify subscription
Notifications
Font Size

Abstract Views: 227

PDF Views: 0




  • Investigations into Roughness of Mass Standards at NPL-I

Abstract Views: 227  |  PDF Views: 0

Authors

Rina Sharma
National Physical Laboratory (CSIR), New Delhi-110012, India
Usha Kiran
National Physical Laboratory (CSIR), New Delhi-110012, India
V. N. Ojha
National Physical Laboratory (CSIR), New Delhi-110012, India
Anil Kumar
National Physical Laboratory (CSIR), New Delhi-110012, India

Abstract


The surface quality of mass standards is on important parameter. Surface roughness of moss standards is important as it is known to be related to contamination with pollutants (such as adsorbed water vapors etc.) and the stability of moss standards. There is a growing interest in surface roughness measurement among mass metrologist. In the present paper we present the work carried out to investigate the roughness of mass standards and try to correlate it with stability of mass standards.

Keywords


Roughness, Mass Standards, White Light Interferometry.