Patent Abstracts on Dimensional Measurement

* Metrology or three-dimensional contactless coordinate measurement of object surfaces by recording of a stack of 2D images using a camera to record images at different focal depths.

* Calibration method for a tri-dimensional metrology system.

* Device for measuring a three-dimensional shape using an optoelectronic metrology process in which light reflected back from a measurement object surface is reflected towards a spectrum analyzer yielding improved accuracy.

* Three dimensional digital metrology measurement of objects using a micro-machine, uses contact and/or laser non contact at end of rod linked to three dimensional positioning system.