Manufacturing Technology Today

Open Access Open Access  Restricted Access Subscription Access
Open Access Open Access Open Access  Restricted Access Restricted Access Subscription Access

Atomic Force Microscopy


     

   Subscribe/Renew Journal


* Topography and Recognition Imaging Atomic Force Microscope and Method of Operation.

* Scanning Probe Microscope.

* Method for Preparing High Polymer Sample for Atomic Force Microscope Research.

* Gold Thin Film Substrate Making Method for Scanning Probe Microscope.

* Probe for an Atomic Force Microscope and Method for Making Such a Probe.

* Method for Micro-Deposition of Molecules on a Substrate by Utilizing an Atomic Force Microscope Tip, by Dispersing Molecules in a Solution of Very Low Saturated Vapour Tension.


User
Subscription Login to verify subscription
Notifications
Font Size

Abstract Views: 261

PDF Views: 0




  • Atomic Force Microscopy

Abstract Views: 261  |  PDF Views: 0

Authors

Abstract


* Topography and Recognition Imaging Atomic Force Microscope and Method of Operation.

* Scanning Probe Microscope.

* Method for Preparing High Polymer Sample for Atomic Force Microscope Research.

* Gold Thin Film Substrate Making Method for Scanning Probe Microscope.

* Probe for an Atomic Force Microscope and Method for Making Such a Probe.

* Method for Micro-Deposition of Molecules on a Substrate by Utilizing an Atomic Force Microscope Tip, by Dispersing Molecules in a Solution of Very Low Saturated Vapour Tension.