Evaluation of Surface Topography and Profile Accuracy to Nano Level

Surface topography and profile play very important role in the performance of components in some high precision applications. Only when advanced technology is coupled with proper measuring and environment conditions nanometric level measurements are possible. Sometimes even improper selection of probes, measuring speed and other parameters, setting of component for measurement, measuring environment, etc could lead to erroneous results. In depth evaluation of these aspects using advanced machines and methods is very crucial for proper analysis of the behaviour of the components under different conditions.