Table of Contents
Vol 11, No 3 (2012)
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Technical Paper
Surface Preparation of Crystal and Characterization of Surface Roughness Using Power Spectral Density Analysis | ||
Nidhi Paliwal, Rina Sharma, Mahesh Chand, V. N. Ojha | ||
Vol 11, No 3 (2012), Pagination: 5-10 | ||
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Profile Measurement Technique of 32 Meter Antenna Reflector for Indian Deep Space Network System | ||
R. Raghunath, N. Ramakrishna Reddy, Ceena Sunil, Narahari Datta, B. Sambasiva Rao, P. V. Murali, Venugopal | ||
Vol 11, No 3 (2012), Pagination: 11-14 | ||
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Performance Verification of High Resolution Angle Measuring Equipment by Laser Interferometry Technique | ||
S. Barman, S. Chatterjee, S. K. Naskar, R. Sen | ||
Vol 11, No 3 (2012), Pagination: 15-18 | ||
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Role of Metrology During Aero Engine Component Testing | ||
Suneel Kumar, M. R. Vijayalakshmi, B. V. Ravidutta, Sreelal Sreedhar | ||
Vol 11, No 3 (2012), Pagination: 19-22 | ||
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Establishment of Optimum Number of Scanning Points for a Scanning Feature Using Ultra Precision CMM | ||
K. Niranjan Reddy, Nithin Narayanan, P. V. Shashi Kumar, Sudhakar C. Jambagi | ||
Vol 11, No 3 (2012), Pagination: 23-26 | ||
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Study of Stylus Bending Effects on CMM Measurements and its Stylus Characterization | ||
Girija Moona, K. P. Chaudhary | ||
Vol 11, No 3 (2012), Pagination: 27-30 | ||
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Events
Calendar of Events | ||
Vol 11, No 3 (2012), Pagination: 31-34 | ||
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Photo Gallery
Metal Working Machinery:Mill, Horizontal Lincoln Milling Machine | ||
Vol 11, No 3 (2012), Pagination: 35-35 | ||
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Abstracts
Manufacturing Technology Abstracts | ||
Vol 11, No 3 (2012), Pagination: 36-47 | ||
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Bibliography
Select Bibliography:Surface Roughness Measurement | ||
Vol 11, No 3 (2012), Pagination: 48-50 | ||
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Patent Abstracts
Patent Abstracts on Surface Roughness Measurement | ||
Vol 11, No 3 (2012), Pagination: 51-56 | ||
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IPR News
IP Valuation at Research Institutes:An Essential Tool for Technology Transfer | ||
Vol 11, No 3 (2012), Pagination: 57-58 | ||
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Abstract Views: 175 | PDF Views: 0 |