Oriental Journal of Computer Science and Technology

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What Causes to Tune a Condition of Exactly Identical Fault-Masks Behaviors in an LFSR based BIST Methodology


Affiliations
1 Department of Electrical and Computer Engineering, College of Engineering, Sultan Qaboos University, Muscat, Oman
 

The authors show that in a Built-In Self-Test (BIST) technique, based on linear-feedback shift registers, when the feedback connections in pseudo-random test-sequence generator and signature analyzer are images of each other and corresponds to primitive characteristic polynomial then behaviors of faults masking remains identical. The simulation results of single stuck-at faults show how the use of such feedback connections in pseudo-random test-sequence generator and signature analyzer yields to mask the same faults.

Keywords

Linear Feedback Shift Register, Characteristic Polynomial, Test Pattern, Built–In Self-Test, Pseudo- Random Test Sequence Generators, Signature Analyzer.
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  • What Causes to Tune a Condition of Exactly Identical Fault-Masks Behaviors in an LFSR based BIST Methodology

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Authors

A. Ahmad
Department of Electrical and Computer Engineering, College of Engineering, Sultan Qaboos University, Muscat, Oman
D. Al Abri
Department of Electrical and Computer Engineering, College of Engineering, Sultan Qaboos University, Muscat, Oman
S. S. Al Busaidi
Department of Electrical and Computer Engineering, College of Engineering, Sultan Qaboos University, Muscat, Oman
M. M. Bait-Suwailam
Department of Electrical and Computer Engineering, College of Engineering, Sultan Qaboos University, Muscat, Oman

Abstract


The authors show that in a Built-In Self-Test (BIST) technique, based on linear-feedback shift registers, when the feedback connections in pseudo-random test-sequence generator and signature analyzer are images of each other and corresponds to primitive characteristic polynomial then behaviors of faults masking remains identical. The simulation results of single stuck-at faults show how the use of such feedback connections in pseudo-random test-sequence generator and signature analyzer yields to mask the same faults.

Keywords


Linear Feedback Shift Register, Characteristic Polynomial, Test Pattern, Built–In Self-Test, Pseudo- Random Test Sequence Generators, Signature Analyzer.

References





DOI: https://doi.org/10.13005/ojcst%2F10.04.02