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A Simple Analysis of Dielectric Properties of PZT


Affiliations
1 Department of Electronics and Communication Engineering, Durgapur Institute of Advanced Technology and Management, Rajbandh, Durgapur, Burdwan - 713212, India
2 Department of Physics, Kalyani Government Engineering College, Kalyani, Nadia - 741235, India
3 Department of Electronics and Communication Engineering, Kalyani Government Engineering College, Kalyani, Nadia - 741235, India
 

Lead Zirconate Titanate (PZT), a very important perovskite material, has been fabricated by ceramic processing method. Dependence of dielectric properties on temperature and frequency of electric field has been investigated. A two layered RC circuit model resembling grain and grain-boundary is employed to analyze the variation of dielectric constant with frequency of electric field. Fluctuations in the measure of dielectric constant are indicative of the presence of defects and impurities in the grain boundary region. Temperature effect has been described by the structural change caused by phase transition which is quite susceptible to the ratio of Zr to Ti in material composition. Specifically near morphotropic phase boundary (MPB) with the presence of mixed tetragonal and rhombohedral phases, a large variation of dielectric constant can effectively be explained by Maxwell-Wagner relaxation of polarization charges at the grain-grain boundary interface.

Keywords

Perovskite Material, Ceramic Processing Method, Dielectric Constant, Morphotropic Phase Boundary, Grain and Grain-Boundary, Maxwell-Wagner Relaxation.
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  • A Simple Analysis of Dielectric Properties of PZT

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Authors

Alokesh Mondal
Department of Electronics and Communication Engineering, Durgapur Institute of Advanced Technology and Management, Rajbandh, Durgapur, Burdwan - 713212, India
Biswajit Maiti
Department of Physics, Kalyani Government Engineering College, Kalyani, Nadia - 741235, India
Achintya Das
Department of Electronics and Communication Engineering, Kalyani Government Engineering College, Kalyani, Nadia - 741235, India

Abstract


Lead Zirconate Titanate (PZT), a very important perovskite material, has been fabricated by ceramic processing method. Dependence of dielectric properties on temperature and frequency of electric field has been investigated. A two layered RC circuit model resembling grain and grain-boundary is employed to analyze the variation of dielectric constant with frequency of electric field. Fluctuations in the measure of dielectric constant are indicative of the presence of defects and impurities in the grain boundary region. Temperature effect has been described by the structural change caused by phase transition which is quite susceptible to the ratio of Zr to Ti in material composition. Specifically near morphotropic phase boundary (MPB) with the presence of mixed tetragonal and rhombohedral phases, a large variation of dielectric constant can effectively be explained by Maxwell-Wagner relaxation of polarization charges at the grain-grain boundary interface.

Keywords


Perovskite Material, Ceramic Processing Method, Dielectric Constant, Morphotropic Phase Boundary, Grain and Grain-Boundary, Maxwell-Wagner Relaxation.



DOI: https://doi.org/10.21843/reas%2F2012%2F1-5%2F108192