Journal of Pure and Applied Ultrasonics

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A Comparative Study of Prediction of Flaw Response and Flaw Detection in Polycrystalline Materials


Affiliations
1 Department of Electrical Engg, University BDT College of Engg, Davangere, India
2 Department of Electrical Engg, Indian Institute of Technology, Roorkee, India
3 Department of Mechanical and Industrial Engg, Indian Institute of Technology, Roorkee, India
4 Naval Surface Warfare Center, Maryland, United States
 

The aim of this paper is to perform a comparative study of flaw response with the grain noise signal in an ultrasonic pulse echo simulation. This is one of the analytical methods to determine the flaw response. The flaw response is predicted using the approximation techniques like Kirchoff approximation, Born approximation and modified Born approximation. The grain noise signal generated in addition to flaw response is modelled analytically. By comparing the results of predicted flaw response and grain noise signal, the possibility of flaw detection can be estimated. Here the flaw considered for study is a spherical void and the material selected for study is a polycrystalline metal. Firstly, the comparison is made for 1 MHz circular transducer and secondly the study is performed for different center frequencies of transducer.

Keywords

Spherical Void, Pulse Echo Simulation, Scattering Amplitude, Grain Noise Signal, Predicted Flaw Response.
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  • A Comparative Study of Prediction of Flaw Response and Flaw Detection in Polycrystalline Materials

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Authors

K. S. Aprameya
Department of Electrical Engg, University BDT College of Engg, Davangere, India
R. S. Anand
Department of Electrical Engg, Indian Institute of Technology, Roorkee, India
B. K. Mishra
Department of Mechanical and Industrial Engg, Indian Institute of Technology, Roorkee, India
S. Ahmed
Naval Surface Warfare Center, Maryland, United States

Abstract


The aim of this paper is to perform a comparative study of flaw response with the grain noise signal in an ultrasonic pulse echo simulation. This is one of the analytical methods to determine the flaw response. The flaw response is predicted using the approximation techniques like Kirchoff approximation, Born approximation and modified Born approximation. The grain noise signal generated in addition to flaw response is modelled analytically. By comparing the results of predicted flaw response and grain noise signal, the possibility of flaw detection can be estimated. Here the flaw considered for study is a spherical void and the material selected for study is a polycrystalline metal. Firstly, the comparison is made for 1 MHz circular transducer and secondly the study is performed for different center frequencies of transducer.

Keywords


Spherical Void, Pulse Echo Simulation, Scattering Amplitude, Grain Noise Signal, Predicted Flaw Response.