Informatics Publishing Limited

S. M. Najib ¹, Mariani Idroas ², M. N. Ibrahim ¹, M. A. H. Ab Ghani ¹

Affiliations
1 Department of Electrical Engineering, University Teknologi Malaysia, 81310, Johor Bahru, Johor, MY
2 Department of Petroleum and Renewable Energy Engineering, University Teknologi, Malaysia, 81310, Johor Bahru, Johor, MY

Abstract

This paper presents the use of Complementary Metal Oxide Semiconductor (CMOS) area image sensor in an optical tomographic instrumentation system to image solid particle in air. The image reconstruction is based on two (2) projections with two CMOS area image sensors configured around a flow pipe. The CMOS area image sensor provides 1280x1024 pixels with a pixel size of 5.2 micron x 5.2 micron, which will provide a high resolution image. The advantage of applying a CMOS area image sensor as an optical sensor is it will minimize the time of getting multiple slices of reconstructed images. Thus, it can generate a 3D reconstructed image of the object easier and faster.

Keywords

CMOS Area Image Sensor, Image Reconstruction, Optical Tomography

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Mariani Idroas ¹, Suhaila M. Najib ², M. Nasir Ibrahim ²

Affiliations
1 Faculty of Chemical and Energy Engineering, University Teknologi Malaysia, 81310 Johor Bahru, Johor, MY
2 Faculty of Electrical Engineering, University Teknologi Malaysia, 81310 Johor Bahru, Johor, MY

Abstract

Quality of food products is important and highly demanded by customers in food industry. All physical attributions (size, shape, texture, concentration and color) of food products have to be considered. Monitoring the particle parameters can affect food flavor, texture, appearance, product size and shelf life. Most of the monitoring systems used in the food industry are based on the grading and sorting inspection such as sampling and Computer Vision technique. However, each of them has their limitations. Therefore, an optical tomography based on Complementary Metal Oxide Semiconductor (CMOS) area image sensor is developed to monitor these particle parameters by visualizing the particle non-invasively inside a flow pipe. The complete optical tomography system has been fabricated to produce a reliable tool to monitor particle characterization and to detect solid particles in flow pipe. The system offers reliable reconstructed images in monitoring particle concentration in air and liquid flows, particle shape and size. The optical tomography system consists of a lighting system, a sensing system that contains a measurement section and CMOS area image sensors, a Data Acquisition System (DAQ) that made up from a microcontroller module, and an image reconstruction system based on MATLAB software. The results obtained are sufficient to collect the qualitative and quantitative information of the particles used in the system to monitor concentration profile in air and liquid.

Keywords

CMOS, Image, Reconstruction, Tomography.

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Norhafizah Ramli ¹, Mariani Idroas ², M. Nasir Ibrahim ¹

Affiliations
1 Faculty of Electrical Engineering, University Teknologi Malaysia, 81310 Johor Bahru, Johor, MY
2 Faculty of Chemical and Energy Engineering, University Teknologi Malaysia, 81310 Johor Bahru, Johor, MY

Abstract

Nowadays, particle characterization such as size, count and shape, has been widely used in industrial processes to provide better understanding on their products. An optical tomography system has proven to be a useful approach in characterizing particles due to its ability to determine the content of a closed system without any physical contact. Thus, this paper presents the use of Complementary Metal Oxide Semiconductor linear image sensor in the development of optical tomography system, where the system is used for solid particle characterization. The developed system used the CMOS S10077 Linear Image Sensor as the optical detector, and Arduino Nano microcontroller to control the sensor’s operation and to provide a data acquisition system for the CMOS S10077. The Data Display Serial Port application is used to display data from the sensor in a numeric array to allow pattern plotting of its result. Particle characterization experiments based on count is conducted after the completion of the hardware and software setup. The experimental results are collected and analyzed. The verification of the experimental and actual results is determined based on the analysis of the particle counts.

Keywords

CMOS, Hardware, Microcontroller, Tomography.

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