Indian Journal of Pure and Applied Physics

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Low Energy X-ray Photons Induced Changes in Lexan Films


Affiliations
1 Microtron Centre, Department of Studies in Physics, Mangalore University, Mangalagangotri 574 199, India
2 School of Applied Sciences (Physics), REVA University, Bangalore 560 064, India
3 Raja Ramanna Centre for Advanced Technology, Indore 452 013, India
4 Savithribhai Phule Pune University, Pune 411 007, India

40 keV Synchrotron X-ray photons were made to fall on Lexan polycarbonate films at different exposure time. The low energy X-ray photons assisted modification in terms of physico-chemical properties of Lexan films were studied using Fourier Transform Infrared (FTIR) spectrophotometer, X-Ray Diffractogram (XRD), Vicker’s Microhardness Tester, Scanning Electron Microscope (SEM) and Contact Angle Meter. FTIR result mainly includes decrease in the C=C stretching and C-C stretching of aromatics after irradiation. XRD analysis shows a slight decrease in the crystallinity after irradiation. Vicker’s microhardness test reveals the decrement in microhardness of Lexan films after irradiation. SEM result shows irradiation induced changes in the surface morphology. Contact angle measurement shows increase in the water contact angle in irradiated Lexan films.
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  • Low Energy X-ray Photons Induced Changes in Lexan Films

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Authors

Raveesha P M
Microtron Centre, Department of Studies in Physics, Mangalore University, Mangalagangotri 574 199, India
Hareesh K
School of Applied Sciences (Physics), REVA University, Bangalore 560 064, India
Dhamgaye V P
Raja Ramanna Centre for Advanced Technology, Indore 452 013, India
Dhole S D
Savithribhai Phule Pune University, Pune 411 007, India
Ganesh Sanjeev
Microtron Centre, Department of Studies in Physics, Mangalore University, Mangalagangotri 574 199, India

Abstract


40 keV Synchrotron X-ray photons were made to fall on Lexan polycarbonate films at different exposure time. The low energy X-ray photons assisted modification in terms of physico-chemical properties of Lexan films were studied using Fourier Transform Infrared (FTIR) spectrophotometer, X-Ray Diffractogram (XRD), Vicker’s Microhardness Tester, Scanning Electron Microscope (SEM) and Contact Angle Meter. FTIR result mainly includes decrease in the C=C stretching and C-C stretching of aromatics after irradiation. XRD analysis shows a slight decrease in the crystallinity after irradiation. Vicker’s microhardness test reveals the decrement in microhardness of Lexan films after irradiation. SEM result shows irradiation induced changes in the surface morphology. Contact angle measurement shows increase in the water contact angle in irradiated Lexan films.