Open Access Open Access  Restricted Access Subscription Access

Nano and Micro Structural Characterization and Effect of Electrical Stress on Microhardness of Laser Dye Rh (6G) Doped PMMA


Affiliations
1 Department of PG Studies & Research in Physics & Electronics, R.D.V.V, Jabalpur – 482 001, M.P, India
 

Polymeric materials of pure and laser dye Rh (6G) doped PMMA with various compositions were prepared by solution cast method. SEM micrographs, designate comprehensive chain formation with homogeneous texture of laser dye Rh (6G) doped PMMA. The AFM imaging helps us to investigate the nanophase domain morphology of the pure and doped specimens. The phase domain distinction emphasizes the difference in the mechanical interface in doped polymers and surface region of the samples. The effect of electrical stress on microhardness studies have been carried out on pure and doped specimens at various loads using Vicker’s microhardness testing. The outcome of SEM and AFM investigations have been correlated with electrically stressed microhardness values.

Keywords

Polymeric Materials, Electrical Stress, Microhardness, SEM and AFM.
User
Notifications
Font Size

Abstract Views: 120

PDF Views: 0




  • Nano and Micro Structural Characterization and Effect of Electrical Stress on Microhardness of Laser Dye Rh (6G) Doped PMMA

Abstract Views: 120  |  PDF Views: 0

Authors

Pradeep Kumar Dubey
Department of PG Studies & Research in Physics & Electronics, R.D.V.V, Jabalpur – 482 001, M.P, India
R. Bajpai
Department of PG Studies & Research in Physics & Electronics, R.D.V.V, Jabalpur – 482 001, M.P, India
J. M. Keller
Department of PG Studies & Research in Physics & Electronics, R.D.V.V, Jabalpur – 482 001, M.P, India

Abstract


Polymeric materials of pure and laser dye Rh (6G) doped PMMA with various compositions were prepared by solution cast method. SEM micrographs, designate comprehensive chain formation with homogeneous texture of laser dye Rh (6G) doped PMMA. The AFM imaging helps us to investigate the nanophase domain morphology of the pure and doped specimens. The phase domain distinction emphasizes the difference in the mechanical interface in doped polymers and surface region of the samples. The effect of electrical stress on microhardness studies have been carried out on pure and doped specimens at various loads using Vicker’s microhardness testing. The outcome of SEM and AFM investigations have been correlated with electrically stressed microhardness values.

Keywords


Polymeric Materials, Electrical Stress, Microhardness, SEM and AFM.