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Continental Impact and Assorted Empirical Study of Intellectual Property Rights


Affiliations
1 ZTM & BPD Unit, ICAR-IARI, New Delhi -110012, India
 

Intellectual property right (IPR) has grown itself into one of the world’s biggest and fastest-growing fields thereby necessitating the demand for critical analysis o f scenarios associated with them for improving the need o f mankind. Therefore, in the present study, an attempt is made to investigate two aspects related with intellectual properties (IP) at global level. Firstly, the significant difference o f average number o f IP filings and IP in-force between continents, when these IP are considered individually, and secondly, when these IP are studied together in the form o f a single vector.

Keywords

WIPO, MANOVA, Patents, Trademarks, Industrial Designs, Standard Errors.
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  • Controller General o f Patents, Designs and Trademarks, http://www. ipindia.nic.in/patents.htm.
  • Intellectual Property India, http://www.ipindia.nic.in/.
  • Intellectual Property India, Trademarks Search, http://www.ipindia.nic.in/trade-marks.htm.
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Abstract Views: 182

PDF Views: 133




  • Continental Impact and Assorted Empirical Study of Intellectual Property Rights

Abstract Views: 182  |  PDF Views: 133

Authors

Swarna Srivastava
ZTM & BPD Unit, ICAR-IARI, New Delhi -110012, India
Chetan
ZTM & BPD Unit, ICAR-IARI, New Delhi -110012, India

Abstract


Intellectual property right (IPR) has grown itself into one of the world’s biggest and fastest-growing fields thereby necessitating the demand for critical analysis o f scenarios associated with them for improving the need o f mankind. Therefore, in the present study, an attempt is made to investigate two aspects related with intellectual properties (IP) at global level. Firstly, the significant difference o f average number o f IP filings and IP in-force between continents, when these IP are considered individually, and secondly, when these IP are studied together in the form o f a single vector.

Keywords


WIPO, MANOVA, Patents, Trademarks, Industrial Designs, Standard Errors.

References