Journal of Surface Science and Technology

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Preparation and Characterization of Pristine PMMA and PVDF Thin Film Using Solution Casting Process for Optoelectronic Devices


Affiliations
1 Department of Physics, Sathyabama University, Chennai - 600119, Tamil Nadu, India
2 Department of Physics, Queen Mary’s College, Chennai - 600004, Tamil Nadu, India
3 Departments of Physics, Madras University, Chennai - 600009, Tamil Nadu, India
     

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The PMMA and PVDF thin films were synthesized by solution casting process. The structural, spectroscopic, and morphological attributes of both the interface and surface of the film have been investigated. The structural properties of pristine PMMA and PVDF thin film were studied by XRD. The XRD spectra showed the detailed state of order and disorder of the system. From the XRD studies amorphous nature as well as the crystallanity (semi crystalline nature) of the polymer thin film were identified. SEM showed the surface morphology of the pristine PMMA and PVDF thin film. From the SEM image the size and the porous nature of the thin film were estimated. The UV showed the absorption characteristics of PMMA and PVDF thin films. From the UV-Visible spectra, we determined the direct and indirect optical energy gap of pristine PMMA and PVDF polymer samples by Devi's and Mott formula and Tauc's Expression. To the best of our knowledge, the direct and indirect energy gap in pristine PMMA and PVDF polymer thin films have been observed for the first time as no such report was found in literature survey.

Keywords

Polycrystalline Surfaces, Polycrystalline Thin Films, XRD, Visible/Ultraviolet Absorption Spectroscopy, Scanning Electron Microscopy (SEM), Optical Band Gap.
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  • J. Puigdollers, C. Voz, I. Artin, A. Orpella, M. Vetter and R. Alcubilla, J. Non-Cryst. Solids., 338, 617 (2004).

  • T. G. Kim, E. H. Jeong, S. C. Lim, S. H. Kim, G. H. Kim, S. H. Kim, H. Y. Jeon and J. Y. Youk, Trans. Syn. Met., 59, 749 (2009).

  • M. Uemura, S. Yoshida, S. Hoshino, T. Kodzasa and T. Kamata, Thin Solid Films, 438, 378 (2003).

  • A. J. Lovinger, Science, 220, 1115 (1983).

  • S. Devikala, P. Kamaraj and M. Arthanareeswari, Chem. Sci. Trans., 2(S1), 129 (2013).

  • H. Ambran, S. Suparno and D. Mitra, IOSR Journal of Applied Physics, 3(1), 7 (2013).

  • J. H. Nahida, International Journal of Basic & Applied Sciences, 12(2), 216 (2014).

  • K. Kaniappan; and S. Latha, International Journal of Chem. Tech. Research, 3(2), 708 (2011).

  • A. Ahamad, M. Y. A. Rahman and H. Hamzah, Open Mater. Sci. J., 5, 170 (2011).

  • S. Sathish and B. Chandar Shekar, Indian J. Pure Appl. Phys., 52, 64 (2014).

  • D. R. Dillon, K. K. Tenneti and C. Y. Li, Polymer, 47, 1678 (2006).

  • A. Winesette, H. Ade and J. Sokolov, Polymer Int., 49, 458 (2000).

  • V. Ostasecicius, I. Milasauskito, R. DaukSevicius, V. Baltrasaitis, V. Grigalianas and I. Prosycevas, Mechanika, 86(6), 78 (2010).

  • R. Gregorio, J. Appl. Polymer Sci., 100, 3272 (2006).

  • Rouaramadan, Ekramajaj and Ahmad, International Journal of Application or Innovation in Engineering Management, 2(11), 240, (2013).

  • N. J. Hameed, Al-Mashhadan and S. Mohamad, Eng. & Tech. Journal, 29(1), 20 (2011).

  • K. W. Chew and K. W. Tan, International Journal of Electro Chemical Science, 6, 5792 (2011).

  • Q. Xia, X. J. Zhao, S. J. Chen and W. Z. Ma. Express Polym. Let., 4(5), 284 (2010).

  • A. R. Bansod, O. P. Chimankar, R. K. Turkar and A. Gandhe, International Journal of Engineering and Technical Research, 2(2), 195 (2014).

  • J. R. Dyer, ‘Applications of Absorption Spectroscopy of Organic Compounds’; Practice Hall Inc., NJ, USA (1994).

  • S. M. Lebedev, O. S. Gefle and M. V. Semenikhin, Journal of Korean Powder Metallurgy Institute, 18(2), 176 (2011).

  • N. F. Mott and E. A. Davis, ‘Electronic Process in Non Crystalline Materials’; Clarendon Press, Oxford (1979).

  • M. A. Doverspike and M. S. Conradi, J. Apply. Phys., 65, 541 (1989).

  • K. W. Chew and K. W. Tan, International Journal of Electro Chemical Science, 6, 5792 (2011).

  • M. Abdelaziz, J. Magn. Magn. Mater., 279, 184 (2004).

  • E. Shobhana, International Journal of Modern Engineering Research, 2(3), 1092 (2012).

  • I. N. Bhatti and M. Banejree, IOSR Journal of Applied Physics, 4(4), 2278 (2013).

  • C. Rameshkumar and R. Subalakshmi, J. Chem. Pharmaceut. Res.,, 7(1), 459 (2015).

  • P. Tamil Selvi and M. Hema, International Journal of Chemtech Research, 6(3), 1864 (2014).

  • K. P. Matabola, A. R. de Vries, A. S. Luyt and R. Kumar, Express Polym. Lett., 5(7), 635 (2011).

  • C. Rameshkumar and R. Subalakshmi, International Journal of Chemtech Research, 7(5), 2532 (2015).

  • H-Y Hwang, D-J Kim and H-J Kim, Transactions of Nonferrous Metals Society of China, 21, 141 (2011).


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  • Preparation and Characterization of Pristine PMMA and PVDF Thin Film Using Solution Casting Process for Optoelectronic Devices

Abstract Views: 318  |  PDF Views: 3

Authors

C. Rameshkumar
Department of Physics, Sathyabama University, Chennai - 600119, Tamil Nadu, India
S. Sarojini
Department of Physics, Queen Mary’s College, Chennai - 600004, Tamil Nadu, India
K. Naresh
Department of Physics, Sathyabama University, Chennai - 600119, Tamil Nadu, India
R. Subalakshmi
Departments of Physics, Madras University, Chennai - 600009, Tamil Nadu, India

Abstract


The PMMA and PVDF thin films were synthesized by solution casting process. The structural, spectroscopic, and morphological attributes of both the interface and surface of the film have been investigated. The structural properties of pristine PMMA and PVDF thin film were studied by XRD. The XRD spectra showed the detailed state of order and disorder of the system. From the XRD studies amorphous nature as well as the crystallanity (semi crystalline nature) of the polymer thin film were identified. SEM showed the surface morphology of the pristine PMMA and PVDF thin film. From the SEM image the size and the porous nature of the thin film were estimated. The UV showed the absorption characteristics of PMMA and PVDF thin films. From the UV-Visible spectra, we determined the direct and indirect optical energy gap of pristine PMMA and PVDF polymer samples by Devi's and Mott formula and Tauc's Expression. To the best of our knowledge, the direct and indirect energy gap in pristine PMMA and PVDF polymer thin films have been observed for the first time as no such report was found in literature survey.

Keywords


Polycrystalline Surfaces, Polycrystalline Thin Films, XRD, Visible/Ultraviolet Absorption Spectroscopy, Scanning Electron Microscopy (SEM), Optical Band Gap.

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DOI: https://doi.org/10.18311/jsst%2F2017%2F6215