Manufacturing Technology Today

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Select Bibliography:Focused Ion Beam


     

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Sub Titles:

* Micromilling of high speed steel (HSS) using focused ion beam (FIB) milling.

* Deep vertical etching of silicon wafers using a hydrogenation-assisted reactive ion etching.

* Mechanical characteristics of FIB deposited carbon nanowires using an electrostatic actuated nano tensile testing device.


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  • Select Bibliography:Focused Ion Beam

Abstract Views: 191  |  PDF Views: 1

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Abstract


Sub Titles:

* Micromilling of high speed steel (HSS) using focused ion beam (FIB) milling.

* Deep vertical etching of silicon wafers using a hydrogenation-assisted reactive ion etching.

* Mechanical characteristics of FIB deposited carbon nanowires using an electrostatic actuated nano tensile testing device.