![Open Access](https://i-scholar.in/lib/pkp/templates/images/icons/fulltextgreen.png)
![Restricted Access](https://i-scholar.in/lib/pkp/templates/images/icons/fulltextred.png)
![Open Access](https://i-scholar.in/lib/pkp/templates/images/icons/fulltextgreen.png)
![Open Access](https://i-scholar.in/lib/pkp/templates/images/icons/fulltext_open_medium.gif)
![Restricted Access](https://i-scholar.in/lib/pkp/templates/images/icons/fulltextred.png)
![Restricted Access](https://i-scholar.in/lib/pkp/templates/images/icons/fulltext_restricted_medium.gif)
Select Bibliography:Focused Ion Beam
Subscribe/Renew Journal
Sub Titles:
* Micromilling of high speed steel (HSS) using focused ion beam (FIB) milling.
* Deep vertical etching of silicon wafers using a hydrogenation-assisted reactive ion etching.
* Mechanical characteristics of FIB deposited carbon nanowires using an electrostatic actuated nano tensile testing device.
User
Subscription
Login to verify subscription
Font Size
Information
![](https://i-scholar.in/public/site/images/abstractview.png)
Abstract Views: 158
![](https://i-scholar.in/public/site/images/pdfview.png)
PDF Views: 1