Manufacturing Technology Today

Open Access Open Access  Restricted Access Subscription Access
Open Access Open Access Open Access  Restricted Access Restricted Access Subscription Access

Select Bibliography:Focused Ion Beam


     

   Subscribe/Renew Journal


Sub Titles:

* Micromilling of high speed steel (HSS) using focused ion beam (FIB) milling.

* Deep vertical etching of silicon wafers using a hydrogenation-assisted reactive ion etching.

* Mechanical characteristics of FIB deposited carbon nanowires using an electrostatic actuated nano tensile testing device.


User
Subscription Login to verify subscription
Notifications
Font Size

Abstract Views: 192

PDF Views: 1




  • Select Bibliography:Focused Ion Beam

Abstract Views: 192  |  PDF Views: 1

Authors

Abstract


Sub Titles:

* Micromilling of high speed steel (HSS) using focused ion beam (FIB) milling.

* Deep vertical etching of silicon wafers using a hydrogenation-assisted reactive ion etching.

* Mechanical characteristics of FIB deposited carbon nanowires using an electrostatic actuated nano tensile testing device.