Topic for this Month is:Vision Based Inspection

* Machine Vision Inspection System and Method Having Improved Operations for Increased Precision Inspection Throughput.

* Ball-grating Array Semiconductor Device Quality Detecting System Based on Dual-eye Machine Vision.

* Systems and Methods for Rapidly Automatically Focusing a Machine Vision Inspection System.

* Smear-limit Based System and Method for Controlling Vision Systems for Consistently Accurate and High-speed Inspection.