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Topic for this Month is:Vision Based Inspection
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* Machine Vision Inspection System and Method Having Improved Operations for Increased Precision Inspection Throughput.
* Ball-grating Array Semiconductor Device Quality Detecting System Based on Dual-eye Machine Vision.
* Systems and Methods for Rapidly Automatically Focusing a Machine Vision Inspection System.
* Smear-limit Based System and Method for Controlling Vision Systems for Consistently Accurate and High-speed Inspection.
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