Open Access Open Access  Restricted Access Subscription Access
Open Access Open Access Open Access  Restricted Access Restricted Access Subscription Access

Functional Evaluation of Copper in Conventional Wire Bonding as Compared to Gold


Affiliations
1 Central Manufacturing Technology Institute, Bengaluru, India
2 Karunya Institute of Technology and Sciences, Coimbatore, India
     

   Subscribe/Renew Journal


In the wire bonding process, the ever increasing gold (Au) price has created a necessity for looking at alternate materials viz., copper (Cu) for wire bonding, allowing Cu wire bonding to make a dramatic progress in recent years. The trend to shift towards Cu wire is expected to advance further in future, thus further improvement of bonding technique is indispensable as there are many challenges viz., handling of fragile pad structure, peeling, cracking below the bond pad, high oxidation rate, hardness and lower bondability of the wire bonds. In this paper, a series of experiments and characterizations (Mechanical, Electrical & SEM (Scanning Electron Microscope) has been conducted with 1mil Au and Cu wires to experimentally prove that Cu is a reliable replacement for Au in wire bonding process.

Keywords

Gold, Copper Ball and Wedge Bonds, Bond Parameters and Characterization.
User
Subscription Login to verify subscription
Notifications
Font Size

  • Chauhan, P; Choubey, A; Zhong, Z; and Pecht, M: Copper Wire Bonding, 2014.
  • Tobergte, DR and Curtis, S: Wire Bonding in Microelectronics, vol. 53, no. 9, 2013.
  • Zhong, ZW:Wire bonding using copper wire, Micro electron. Int., vol. 26, no. 1, pp. 10–16, 2009.
  • England, L; Eng, ST; Liew, C; and Lim, HH: Cu wire bond parameter optimization on various bond pad metallization and barrier layer material schemes, Micro Electron. Reliab, vol. 51, no. 1, Jan. 2011, pp. 81–87.
  • S. Kaimori, T. Nonaka, and A. Mizoguchi, “The development of Cu bonding wire with oxidation-resistant metal coating,” IEEE Trans. Adv. Packag., vol. 29, no. 2, pp. 227–231, 2006.
  • M. N. M. Ching and K. J. Lee, “Influence of nitrogen and forming gas towards palladium coated copper wire,” 2011 IEEE 13th Electron. Packag. Technol. Conf. EPTC 2011, pp. 318–323, 2011.
  • S. Srikamonsirisak, U. Tantinuchawong, and Y. Satirakul, “Parameters Optimization of Copper Wire Bonding on Thin Small Outline Package,” vol. 23, no. 1, pp. 13–17, 2013.
  • MIL-STD-883G, “Department of Defense Test Method Standard Microcircuits”.
  • George Harman “Wire Bonding in Microelectronics” Third Edition.
  • Heraeus “Bonding wires for Semiconductor Technology”.
  • Jaesik Lee, “Process Quality Improvement in Thermosonic Wire Bonding”.
  • Flynn Carson, STATS ChipPAC Inc., 47400 Kato Rd, Fremont, CA 94538, “Die to Die Copper Wire Bonding Enabling Low Cost 3D Packaging”
  • Chapter A: Wire bonding, “Bond evaluation methods”
  • Journal of Metals, Materials and Minerals, Vol.23 No.1 pp.13-17, 2013, “Parameters Optimization of Copper Wire Bonding on Thin Small Outline Package”
  • C. D. Breach, Gold Bulletin, vol. 43 no. 3 2010, “What is the future of bonding wire? Will copper entirely replace gold?”
  • Article-24 March 2014 Microelectronics Reliability, “Insulated Cu wire free air ball characterization”.
  • Randy Schueller, Ph.D. DfR Solutions Minneapolis, MN, “COPPER WIRE BOND FAILURE MECHANISMS”.
  • U.S std book, NBS Technical note 726, “Testing and Fabrication of Wire Bond Electrical connections- A comprehensive survey”

Abstract Views: 283

PDF Views: 0




  • Functional Evaluation of Copper in Conventional Wire Bonding as Compared to Gold

Abstract Views: 283  |  PDF Views: 0

Authors

S. Harsha
Central Manufacturing Technology Institute, Bengaluru, India
S. Mahalakshmi
Central Manufacturing Technology Institute, Bengaluru, India
Alexander George
Karunya Institute of Technology and Sciences, Coimbatore, India

Abstract


In the wire bonding process, the ever increasing gold (Au) price has created a necessity for looking at alternate materials viz., copper (Cu) for wire bonding, allowing Cu wire bonding to make a dramatic progress in recent years. The trend to shift towards Cu wire is expected to advance further in future, thus further improvement of bonding technique is indispensable as there are many challenges viz., handling of fragile pad structure, peeling, cracking below the bond pad, high oxidation rate, hardness and lower bondability of the wire bonds. In this paper, a series of experiments and characterizations (Mechanical, Electrical & SEM (Scanning Electron Microscope) has been conducted with 1mil Au and Cu wires to experimentally prove that Cu is a reliable replacement for Au in wire bonding process.

Keywords


Gold, Copper Ball and Wedge Bonds, Bond Parameters and Characterization.

References