An Embedded System based Approach to Pulsed Ultrasonic Instrumentation

In recent days, instruments with modern designs, high accuracy, high reliability and flexibility are in demand for the non-destructive characterization of materials. Ultrasonic velocity and attenuation are the basic measurement parameters used to evaluate various molecular phenomena and physical characteristics of materials and formulate appropriate theories. Hence, precise measurement of these parameters comes to be of immense help in the studies.