Indian Journal of Science and Technology

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Expected Response Time Model Considering Churn Rate for Dynamic IoT Devices


Affiliations
1 Department of Information and Communication Engineering, Hannam University, Daejeon, Korea, Republic of
2 Department of Computer and Information Engineering, Hoseo University, Cheonan, Korea, Republic of
3 Department of Computer Engineering, Hansung University, Seoul, Korea, Republic of
 

Background/Objectives: IoT has dynamic characteristics that the devices are freely joined or leave the networks. In this paper, we propose an expected response time model in a dynamic IoT environment. Methods/Statistical Analysis: We analyze the expected response time of an IoT query for star, tree, and mesh topologies. We evaluate the proposed model by comparing how it affects to response time according to the network topology and the bounce rate. Findings: We found that the impact of churn rates shows significantly different results under various topologies. Thus, churn rate is an important consideration in dynamic device replacement procedure that replaces a faulty device with a relatively healthy device. Improvements: Our analytical tool can be used for a decision mechanism of the IoT node that will operate most effective for time-critical IoT applications.

Keywords

Churn Rate, Dynamic Networks, Device Replacement Procedure, Response Time, Time-critical IoT Application.
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  • Expected Response Time Model Considering Churn Rate for Dynamic IoT Devices

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Authors

Jinman Jung
Department of Information and Communication Engineering, Hannam University, Daejeon, Korea, Republic of
Hong Min
Department of Computer and Information Engineering, Hoseo University, Cheonan, Korea, Republic of
Junyoung Heo
Department of Computer Engineering, Hansung University, Seoul, Korea, Republic of

Abstract


Background/Objectives: IoT has dynamic characteristics that the devices are freely joined or leave the networks. In this paper, we propose an expected response time model in a dynamic IoT environment. Methods/Statistical Analysis: We analyze the expected response time of an IoT query for star, tree, and mesh topologies. We evaluate the proposed model by comparing how it affects to response time according to the network topology and the bounce rate. Findings: We found that the impact of churn rates shows significantly different results under various topologies. Thus, churn rate is an important consideration in dynamic device replacement procedure that replaces a faulty device with a relatively healthy device. Improvements: Our analytical tool can be used for a decision mechanism of the IoT node that will operate most effective for time-critical IoT applications.

Keywords


Churn Rate, Dynamic Networks, Device Replacement Procedure, Response Time, Time-critical IoT Application.



DOI: https://doi.org/10.17485/ijst%2F2016%2Fv9i20%2F133327