Indian Journal of Pure and Applied Physics

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Synthetization and Characterization of Mg-doped SnSe with Mg Substitution at the Sn Site by High Energy Ball Milling Technique


Affiliations
1 University School of Basic and Applied Sciences, Guru Gobind Singh Indraprastha University, Delhi 110 078, India
2 Department of Physics, Sri Sathya Sai Institute of Higher Learning, Prasanthinilayam, A.P 515 134, India
 

Tin selenide (SnSe) is a semiconductor with an orthorhombic crystal structure having an indirect and direct band gap of 0.9 eV and 1.3 eV respectively. The SnSe and Mg-doped SnSe was synthesized by high energy ball milling technique at 300 RPM for 22 hrs. The formation of pure orthorhombic phases of SnSe and Mg-doped SnSe were confirmed by X-ray diffraction (XRD). From the XRD pattern, the crystalline size was estimated which lies below ~10 nm. The morphology of particle size distribution was carried out by scanning electron microscopy (SEM).

Keywords

Phase purification; Ball milling; SnSe; Doping.
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  • Synthetization and Characterization of Mg-doped SnSe with Mg Substitution at the Sn Site by High Energy Ball Milling Technique

Abstract Views: 84  |  PDF Views: 48

Authors

Mukesh Kumar Bairwa
University School of Basic and Applied Sciences, Guru Gobind Singh Indraprastha University, Delhi 110 078, India
R. Gowrishankar
Department of Physics, Sri Sathya Sai Institute of Higher Learning, Prasanthinilayam, A.P 515 134, India
Anjali Saini
University School of Basic and Applied Sciences, Guru Gobind Singh Indraprastha University, Delhi 110 078, India
S. Neeleshwar
University School of Basic and Applied Sciences, Guru Gobind Singh Indraprastha University, Delhi 110 078, India

Abstract


Tin selenide (SnSe) is a semiconductor with an orthorhombic crystal structure having an indirect and direct band gap of 0.9 eV and 1.3 eV respectively. The SnSe and Mg-doped SnSe was synthesized by high energy ball milling technique at 300 RPM for 22 hrs. The formation of pure orthorhombic phases of SnSe and Mg-doped SnSe were confirmed by X-ray diffraction (XRD). From the XRD pattern, the crystalline size was estimated which lies below ~10 nm. The morphology of particle size distribution was carried out by scanning electron microscopy (SEM).

Keywords


Phase purification; Ball milling; SnSe; Doping.

References