Structural and Morphological Investigation of Copper (I) Iodide Utilized as a Hole Transport Layer in Perovskite Solar Cells

Hybrid Halide Perovskite (HHP) solar cells are considered as a most promising candidate for the next generation of photovoltaics. The charge transport layer namely, the hole transport layer (HTL) plays a vital role in the device performance of perovskite solar cells (PSCs). Besides the power conversion efficiency (PCE), the stability and cost are two significant factors for deciding the commercialization of PSC device. The HTL bears a significant portion of the PSC's cost, and the degradation of the PSCs occurs in the presence of organic HTL. The inorganic HTL, Copper (I) iodide (CuI), a p-type semiconductor, is a good choice for HTL due to its chemical stability, low cost, and low band gap. In this work, we deal with the structural and morphological investigation of CuI thin film using X-ray Diffraction and Scanning Electron Microscopy analysis, respectively. The utilization of such inorganic HTL will help the researchers in fabricating the low-cost PSC devices.